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Methodology to Skip the Memory Test Using ASB (At Speed Board)
Young Dae Kim, Samsung Electronics Co. Ltd.
SiP is divided into stack, side-by-side, POP, and other types. Especially, memory, analog embedded SiP is basically applied in the various field. In this presentation, we introduce ASB (At Speed Test) and the evaluation result to overcome many problems (Burn-in, temperature, parallel test, cost etc) to guarantee the memory (including flash) quality. Using ASB, in POP, the good result was brought out to skip the memory test. Based on this experiment, we will have a correlation to skip the unit memory test using ASB.
Young Dae Kim is a Senior Engineer & Blackbelt of six sigma. He works for the Product Technology Team System, LSI Division Semiconductor Business Samsung Electronics Co., Ltd.