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RF BIST (Built-In Self-Test) Scheme for Low Noise Amplifier (LNA) in RF Systems
Bruce Kim, University of Alabama
This paper presents a new low-cost RF Built-In Self-Test (BIST) circuit for measuring RF parameters for 5.25GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18um SiGe technology. The test technique using BIST circuit utilizes input impedance matching and output transient voltage measurements. A set of derived mathematical equations are used to calculate RF parameters from low-cost DC measurements. The entire concept is low-cost due to using DC measurements rather than using traditional RF measurements for RF parameters.
Bruce Kim is an Associate Professor at the University of Alabama in Tuscaloosa. He is a senior member of IEEE and IMAPS. He is an associate editor of the IEEE Transactions of Advanced Packaging. His research involves testing of RF and mixed-signal integrated circuits.