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Multi-site Test with Full Diagnosis Support
Peter Muhmenthaler, Infineon Technologies
A new manufacturing test flow will be described, which fulfills high throughput constraints and provides test results to be automatically diagnosed for identification of yield detractors. The essential elements of such a flow: ATE-hardware and EDA-software, are characterized and the current performance is evaluated. Especially in wafer test, where feedback of test results is a mandatory task for product and process engineering to enhance process yield, such new fault diagnosis can be realized to cover all fail chips of a test floor without excessive investment. As a result a monitoring diagnosis process, which is continously executed, offers never seen transparency into the yield limiters of each product.
Peter Muhmenthaler works in Principal Test Innovation & Methodology in the Corporate Test Technology Division of Infineon Technologies AG. He received a diploma in electrical engineering from the University of Hannover, Germany in 1988. He has worked for Infineon/ Siemens since 1989: from 1989-91 he was a Test & DFT engineer for DRAMs; from 1991-95 he was involved in Design Flow development with focus on macro cell / IP development; and from 1995-2005 he built up competence for VLSI test technololgy and DFT. His current position is Director of Test Solutions, and his primary focus is on monitoring diagnosis and test program standardization.