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Built-in-Test Solutions for SiP

Philippe Cauvet, Philips Semiconductors

The performance of data converters in SiPs being increasingly higher, the analog interfaces need higher resolutions and higher speeds, while the noise and the distortion products have to be lowered. The dynamic test of the data converters and the analog blocks in the path, becomes more and more challenging and costly. In this presentation, we show two complementary methods for implementing a built-in test solution at system level.

The presentation starts with a brief reminder of

1. The errors, which can be split in two types: a) Stochastic (noise and jitter), and b) Deterministic, mainly caused by non-linearities

2. The parameters which aim at detecting these errors: SNR, SINAD, THD, etc.

The second part of the presentation shows the works that have been conducted to estimate and compensate the jitter and the noise of the test environment.

The next part of the presentation deals with a novel method to estimate the INL from a spectrum.

The technique consists in finding the analytic expression linking the interpolated INL based on Fourier series with the spectral information of the converted signal.

In the last section, we show the application of the methods to the test of SiPs at system level. The basic idea is to re-use a Digital-to-Analog Converter as an Arbitrary Waveform Generator, and an ADC as a Digitizer.

Furthermore, we conclude with an extrapolation to loop-back testing and diagnostics.

Philippe Cauvet graduated as an Engineer in Physics-Instrumentation from the Conservatoire National des Arts et Métiers, France, 1989. He has been working with Philips Semiconductors for 24 years, and is now the Test Manager of the Silicon-Based SiP Program, after 15 years dedicated to Data Converters and Digital testing. A member of several international working groups, he is also in charge of the technical co-operation with public research in test technologies and methods. His main hobbies are singing, guitar and playing golf.