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Known-Good-Die Test Strategies
Anton Chichkov, AMI Semiconductor
This tutorial will review test strategies used to achieve quality requirements in different market segments on balanced cost. Market segments covered will include consumer, industrial and critical life-saving applications (i.e. automotive and medical). Current challenges for test defined by new technologies and current ATE limitations are discussed. Evolutions of standard and emerging methods will be reviewed. This includes standard strategies for digital ASICs (ATPG trends, current based testing evolution, etc.), and standard strategies for mixed-signal ASICs (spec-based, application-oriented and structural testing).
Anton Chichkov graduated in 1990 in VLSI design at the Technical University of Sofia, Bulgaria. He worked for a couple of years as a VLSI designer in the automatic test equipment (ATE) development team. He then joined the test and measurement research group in the R&D institute INESC in Lisbon, Portugal. In 1998, he received a Ph.D. in Hardware Software Co-Design from the Technical University of Lisbon. Currently Mr. Chichkov is Test Methodology Engineering Manager at AMIS, Corporate and is responsible for digital and mixed signal test methodology and test tools. He has earned several publications in high speed ASICs design, ASIC emulation techniques, HW/SW co-design and current based test methods. He has two patents on automatic test program generation methods and tools.