Implementing Adaptive Test

Jeff Bibbee, Jeff Bibbee PC

Adaptive test is a term used to describe a system that learns test process parameters and adapts the test flow to optimize the tests performed on each wafer die or packaged part. Effective implementation of adaptive test requires a carefully designed approach for each product type and a multi-disciplined team. Case studies reveal that adaptive test can actually increase quality levels while dramatically reducing test time at both wafer probe and package test.

Jeff Bibbee is a 25-year veteran of semiconductor test and has the unique experience of working with digital, memory and mixed signal products. Throughout his career, Jeff pioneered many industry firsts. Jeff holds a BSEE and five patents. Jeff is currently an independent industry consultant working in all areas of test improvement.